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Publication Citation: On-Wafer Measurement of Transistor Noise Parameters at NIST

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Author(s): James P. Randa; David K. Walker;
Title: On-Wafer Measurement of Transistor Noise Parameters at NIST
Published: April 01, 2007
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
Citation: IEEE Transactions on Instrumentation and Measurement
Volume: 56
Issue: 2
Pages: pp. 551 - 554
Keywords: on-wafer measurement, noise measurement, transistor noise parameters, uncertainty analysis
Research Areas: Electronics & Telecommunications, Microelectronics, Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (147KB)