| Author(s): |
James P. Randa; David K. Walker; |
| Title: |
On-Wafer Measurement of Transistor Noise Parameters at NIST |
| Published: |
April 01, 2007 |
| Abstract: |
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. We describe the measurement method and the uncertainty analysis and present results of measurements on a very poorly matched transistor. |
| Citation: |
IEEE Transactions on Instrumentation and Measurement |
| Volume: |
56 |
| Issue: |
2 |
| Pages: |
pp. 551 - 554 |
| Keywords: |
on-wafer measurement, noise measurement, transistor noise parameters, uncertainty analysis |
| Research Areas: |
Electronics & Telecommunications, Microelectronics, Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (144KB) |
