| Author(s): |
James P. Randa; Tom McKay; Susan L. Sweeney; David K. Walker; Lawrence Wagner; David R. Greenberg; Jon Tao; G. Ali Rezvani; |
| Title: |
Reverse Noise Measurement and Use in Device Characterization |
| Published: |
June 10, 2006 |
| Abstract: |
We review the concept of reverse noise measurements in the context of on-wafer transistor noise characterization. Several different applications of reverse noise measurements are suggested and demonstrated. Reverse measurements can be used to check measurement results, to significantly reduce the uncertainty in Γ optu , to reduce the occurence of unphysical results, and possibly to directly measure or constrain parameters in model of transistors. |
| Conference: |
2006 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS SYMPOSIUM JUNE 11-13, 2006 |
| Pages: |
4 pp. |
| Location: |
SAN FRANCISCO, CA |
| Dates: |
June 11-13, 2006 |
| Keywords: |
CMOS, noise, noise measurements, on-wafer measurements |
| Research Areas: |
Electronics & Telecommunications, Microelectronics, Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (185KB) |
