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NIST Authors in Bold
|Author(s):||James P. Randa; David K. Walker;|
|Title:||On-Wafer Noise-Parameter Measurements at NIST|
|Published:||July 14, 2006|
|Abstract:||NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor.|
|Conference:||Conference on Precision Electromagnetic Measurements|
|Pages:||pp. 656 - 657|
|Dates:||July 9-14, 2006|
|Keywords:||noise,noise measurement,noise parameter,on-wafer measurement,transistor noise|
|Research Areas:||Electronics & Telecommunications, Microelectronics, Electromagnetics|
|PDF version:||Click here to retrieve PDF version of paper (401KB)|