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Publication Citation: On-Wafer Noise-Parameter Measurements at NIST

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Author(s): James P. Randa; David K. Walker;
Title: On-Wafer Noise-Parameter Measurements at NIST
Published: July 14, 2006
Abstract: NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor.
Conference: Conference on Precision Electromagnetic Measurements
Pages: pp. 656 - 657
Location: Turin, IT
Dates: July 9-14, 2006
Keywords: noise;noise measurement;noise parameter;on-wafer measurement;transistor noise
Research Areas: Electronics & Telecommunications, Microelectronics, Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (401KB)