| Author(s): |
James P. Randa; David K. Walker; |
| Title: |
On-Wafer Noise-Parameter Measurements at NIST |
| Published: |
July 14, 2006 |
| Abstract: |
NIST has developed the capability to measure noise parameters on a wafer int he 1-12.4 GHz range. In this paper we briefly describe the measurement methods and the uncertainty analysis and present results of measurements on a very poorly matched transistor. |
| Conference: |
Conference on Precision Electromagnetic Measurements |
| Pages: |
pp. 656 - 657 |
| Location: |
Turin, IT |
| Dates: |
July 9-14, 2006 |
| Keywords: |
noise;noise measurement;noise parameter;on-wafer measurement;transistor noise |
| Research Areas: |
Electronics & Telecommunications, Microelectronics, Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (392KB) |
