NIST Authors in Bold
| Author(s): | Catherine A. Remley; Paul D. Hale; David I. Bergman; Darryl A. Keenan; |
|---|---|
| Title: | Comparison of Multisine Measurements from Instrumentation Capable of Nonlinear System Characterization |
| Published: | December 01, 2006 |
| Abstract: | We compare measurements of simple multisines using instruments capable of characterizing both magnitude and relative phase the measured signals. All three instruments we compared reported relative phase measurements within a few degrees of each other at microwave frequencies for both wide and narrow modulation bandwidths. |
| Conference: | ARFTG Microwave Measurement Conference |
| Proceedings: | ARFTG Microwave Measurement Conference Digest |
| Pages: | pp. 34 - 43 |
| Location: | Washington, DC |
| Dates: | December 1-2, 2005 |
| Research Areas: | Electromagnetics |