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|Author(s):||Dylan F. Williams; Arkadiusz C. Lewandowski; Tracy S. Clement; C. M. Wang; Paul D. Hale; Juanita M. Morgan; Darryl A. Keenan; Andrew Dienstfrey;|
|Title:||Covariance-Based Uncertainty Analysis of the NIST Electrooptic Sampling System|
|Published:||January 01, 2006|
|Abstract:||We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electro-optic sampling system. This description offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency-domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode.|
|Citation:||IEEE Transactions on Microwave Theory and Techniques|
|Pages:||pp. 481 - 491|
|Keywords:||covariance matrix,electro-optic sampling,impulse response,Jacobian,standard uncertainty,uncertainty,uncertainty propagation,variance|
|DOI:||http://dx.doi.org/10.1109/TMTT.2005.860492 (Note: May link to a non-U.S. Government webpage)|