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Publication Citation: Covariance-Based Uncertainty Analysis of the NIST Electro-optic Sampling System

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Author(s): Dylan F. Williams; Arkadiusz C. Lewandowski; Tracy S. Clement; C. M. Wang; Paul D. Hale; Juanita M. Morgan; Darryl A. Keenan; Andrew Dienstfrey;
Title: Covariance-Based Uncertainty Analysis of the NIST Electro-optic Sampling System
Published: January 01, 2006
Abstract: We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electro-optic sampling system. This description offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency-domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode.
Citation: IEEE Transactions on Microwave Theory and Techniques
Volume: 54
Pages: pp. 481 - 491
Keywords: covariance matrix;electro-optic sampling;impulse response;Jacobian;standard uncertainty;uncertainty;uncertainty propagation;variance
Research Areas: Electromagnetics