| Author(s): |
Dylan F. Williams; Arkadiusz C. Lewandowski; Tracy S. Clement; C. M. Wang; Paul D. Hale; Juanita M. Morgan; Darryl A. Keenan; Andrew Dienstfrey; |
| Title: |
Covariance-Based Uncertainty Analysis of the NIST Electro-optic Sampling System |
| Published: |
January 01, 2006 |
| Abstract: |
We develop a covariance matrix describing the uncertainty of mismatch-corrected measurements performed on the National Institute of Standards and Technology's electro-optic sampling system. This description offers a general way of describing the uncertainties of the measurement system in both the temporal and frequency-domains. We illustrate the utility of the approach with several examples, including determining the uncertainty in the temporal voltage generated by the photodiode. |
| Citation: |
IEEE Transactions on Microwave Theory and Techniques |
| Volume: |
54 |
| Pages: |
pp. 481 - 491 |
| Keywords: |
covariance matrix;electro-optic sampling;impulse response;Jacobian;standard uncertainty;uncertainty;uncertainty propagation;variance |
| Research Areas: |
Electromagnetics |
