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NIST Authors in Bold
|Author(s):||John A. Small; Dale E. Newbury; John Henry J. Scott; L. King; Sae Woo Nam; Kent D. Irwin; Steven Deiker; Shaul Barkan; Jan Iwanczyk;|
|Title:||A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems|
|Published:||December 31, 2002|
|Abstract:||NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer (υcal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The instrument is also equipped with a conventional Si-Li x-ray detector (LINK ISIS 3 position turret) and a JEOL wavelength dispersive x-ray spectrometer. NIST, Gaithersburg staff have had the opportunity to work with these new detector technologies as "users" and to compare preliminary results with conventional systems.|
|Citation:||Microscopy and Microanalysis|
|Pages:||pp. 82 - 83|