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|Author(s):||Dylan F. Williams; Jack Wang; Uwe Arz;|
|Title:||VNA Calibration Software Manual|
|Published:||June 01, 2003|
|Abstract:||This software algorithm combines a decade of experience in applying orthogonal distance regression and other iterative techniques to solving vector-network-analyzer (VNA) calibrations. The new software features a robust algorithm capable of finding solutions without initial estimates, greatly increasing its ease of use and broadening its applicability. The algorithm not only estimates the uncertainty of its own results due to random errors from residual deviations from the VNA calibration model, but estimates systematic errors in the solution. The uncertainties in the solution are represented by a covariance matrix that relates errors in both the VNA calibration and measurements of the device under test. In addition, the algorithm determines coverage factors based on the different numbers of degrees of freedom associated with various parts of the solution. The new algorithm outperforms NIST's popular MultiCal software in the presence of measurement noise, and is backed by experiments demonstrating the accuracy of the uncertainty estimates generated by the algorithm.|
|Citation:||EEEL High-speed Microelectronics Software Download Page|
|Keywords:||calibration,scattering parameters,vector network analyzer|
|Research Areas:||Microwave Measurement Services|