| Author(s): |
Michelle D. Chabot; John M. Moreland; |
| Title: |
Micrometer-scale magnetometry of thin Ni80Fe20 films using ultra-sensitive microcantilevers |
| Published: |
May 15, 2003 |
| Abstract: |
Microcantilever torque magnetometry is used to measure quantitative M-H curves on patterned Ni80Fe20 films. The dynamic deflection method is employed, in which a small film is deposited onto a microcantilever and placed in an external magnetic field. A small orthogonal ac torque field is applied at the cantilever resonant frequency, and the resulting torque is measure as a function of external field. Cantilever fabrication has been integrated with film deposition. Results are presented for a 5 micron x 5 micron x 30 nm NiFe film. The measured saturated magnetic moment of the sample si 5.1 × 10-13 ± 2 × 10-14 Am2 for a 100 A/m torque filed. The M-H curves for the smaller films show hysteretic switching consistent with a series of stable multi-domain states. Values of the saturation magnetization are within 3% of the value measured on similar samples by ferromagnetic resonance, indicating this is a sensitive method for measuring magnetic reversal in small ferromagnetic samples. |
| Citation: |
Journal of Applied Physics |
| Volume: |
93 |
| Issue: |
10 |
| Pages: |
pp. 7897 - 7899 |
| Keywords: |
cantilever magnetometry;micromechanical systems;patterned films |
| Research Areas: |
Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (197KB) |
