NIST Authors in Bold
| Author(s): | John M. Martinis; Kent D. Irwin; David A. Wollman; Gene C. Hilton; L L. Dulcie; Norman F. Bergren; |
|---|---|
| Title: | The Next Generation of EDS: Microcalorimeter EDS with 3 eV Energy Resolution |
| Published: | July 01, 1998 |
| Abstract: | |
| Proceedings: | Proc., Microscopy & Microanalysis 1998 |
| Pages: | pp. 172 - 173 |
| Location: | Atlanta, GA |
| Dates: | July 12-16, 1998 |
| Research Areas: | Nanoelectronics and Nanoscale Electronics |