Publication Citation
NIST Authors in Bold
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| Author(s): | Dylan F. Williams; Ronald C. Wittmann; |
|---|---|
| Title: | Computation of Causal Characteristic Impedences |
| Published: | June 12, 2000 |
| Abstract: | |
| Conference: | IEEE MTT-S Intl. Symp. |
| Pages: | pp. 1813 - 1816 |
| Location: | Boston, MA |
| Dates: | June 12-16, 2000 |
| Research Areas: | Microwave Measurement Services |