NIST Authors in Bold
| Author(s): | R W. Cross; J O. Oti; Thomas J. Silva; Y K. Kim; |
|---|---|
| Title: | Magnetoresistance of Thin-Film NiFe Devices Exhibiting Single-Domain Behavior |
| Published: | November 01, 1995 |
| Abstract: | |
| Citation: | IEEE Transactions on Magnetics |
| Volume: | 31(6) |
| Pages: | pp. 3358 - 3360 |
| Research Areas: | Law Enforcement |
| PDF version: | Click here to retrieve PDF version of paper (401KB) |