Publication Citation
NIST Authors in Bold
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| Author(s): | Stephen E. Russek; R W. Cross; Steven C. Sanders; J O. Oti; |
|---|---|
| Title: | Size Effects in Submicron NiFe/Ag GMR Devices |
| Published: | November 01, 1995 |
| Abstract: | |
| Citation: | IEEE Transactions on Magnetics |
| Volume: | 31(6) |
| Pages: | pp. 3939 - 3942 |
| Research Areas: | Data and Informatics |
| PDF version: |  Click here to retrieve PDF version of paper (349KB) |