NIST Authors in Bold
| Author(s): | Stephen E. Russek; J O. Oti; Shehzaad F. Kaka; E Y. Chen; |
|---|---|
| Title: | High-Speed Characterization of Submicrometer Giant Magnetoresistive Devices |
| Published: | April 01, 1999 |
| Abstract: | |
| Citation: | Journal of Applied Physics |
| Volume: | 85 (8) |
| Pages: | pp. 4773 - 4775 |
| Research Areas: | Data and Informatics |
| PDF version: | Click here to retrieve PDF version of paper (350KB) |