Publication Citation
NIST Authors in Bold
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| Author(s): | John (. Ekin; John W. West; |
|---|---|
| Title: | Mechanisms for Critical-Current Degradation in NbTi and Nb3Sn and NbTi Multifilamentary Wires |
| Published: | January 01, 1977 |
| Abstract: | |
| Citation: | IEEE Transactions on Applied Superconductivity |
| Research Areas: | Superconductors |