Publication Citation
NIST Authors in Bold
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| Author(s): | G Fujii; John (. Ekin; Ray Radebaugh; Alan F. Clark; |
|---|---|
| Title: | Effect of Thermal Contraction of Sample Holder Material on Critical Current Measurement |
| Published: | August 01, 1980 |
| Abstract: | |
| Citation: | Advances in Cryogenic Engineering |
| Research Areas: | Superconductors |