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Publication Citation: Effect of Room Temperature Stress on the Critical Current of NbTi

NIST Authors in Bold

Author(s): S L. Bray; John (Jack) W. Ekin;
Title: Effect of Room Temperature Stress on the Critical Current of NbTi
Published: January 01, 1989
Abstract:
Citation: Journal of Applied Physics
Volume: 65(2)
Pages: pp. 684 - 687
Research Areas: Superconductors
PDF version: PDF Document Click here to retrieve PDF version of paper (719KB)