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NIST Authors in Bold
|Author(s):||S L. Bray; John (Jack) W. Ekin; M J. Nilles;|
|Title:||Fatigue-Induced Electrical Degradation of Composite High-Purity/High-Strength Aluminum Rings at 4 K|
|Published:||January 01, 1998|
|Citation:||Advances in Cryogenic Engineering|