NIST Authors in Bold
| Author(s): | S L. Bray; John (. Ekin; M J. Nilles; |
|---|---|
| Title: | Fatigue-Induced Electrical Degradation of Composite High-Purity/High-Strength Aluminum Rings at 4 K |
| Published: | January 01, 1998 |
| Abstract: | |
| Citation: | Advances in Cryogenic Engineering |
| Issue: | 44 |
| Research Areas: | Superconductors |