NIST Authors in Bold
| Author(s): | John M. Moreland; Paul Rice; Stephen E. Russek; B. Jeanneret; Alexana Roshko; David A. Rudman; Ronald H. Ono; |
|---|---|
| Title: | Scanning Tunneling Microscopy of the Surface Morphology of YBa2Cu3Ox Thin-Films Between 300 K and 76 K |
| Published: | December 01, 1991 |
| Abstract: | |
| Citation: | Applied Physics Letters |
| Volume: | 59(23) |
| Pages: | pp. 3039 - 3041 |
| Research Areas: | Law Enforcement |
| PDF version: | Click here to retrieve PDF version of paper (526KB) |