Publication Citation
NIST Authors in Bold
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| Author(s): | John M. Moreland; Todd E. Harvey; Ronald H. Ono; Alexana Roshko; |
|---|---|
| Title: | Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates |
| Published: | March 01, 1993 |
| Abstract: | |
| Citation: | IEEE Transactions on Applied Superconductivity |
| Volume: | 3(1) |
| Pages: | pp. 1586 - 1589 |
| Research Areas: | Law Enforcement |