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Publication Citation: Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates

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Author(s): John M. Moreland; Todd E. Harvey; Ronald H. Ono; Alexana Roshko;
Title: Scanned Probe Microscopy of YBa2Cu3Ox Thin-Film Device Structures on Si Substrates
Published: March 01, 1993
Abstract:
Citation: IEEE Transactions on Applied Superconductivity
Volume: 3(1)
Pages: pp. 1586 - 1589
Research Areas: Law Enforcement