NIST Authors in Bold
| Author(s): | Kristine A. Bertness; C Kramer; J M. Olson; John M. Moreland; |
|---|---|
| Title: | In Situ Observation of Surface Morphology of InP Grown on Singular and Vicinal (001) Substrates |
| Published: | January 01, 1994 |
| Abstract: | |
| Citation: | Journal of Electronic Materials |
| Volume: | 23(2) |
| Pages: | pp. 195 - 200 |
| Research Areas: | Law Enforcement |