NIST Authors in Bold
| Author(s): | K Tachikawa; K Itoh; H Wada; D Gould; H Jones; C R. Walters; Loren F. Goodrich; John (. Ekin; S L. Bray; |
|---|---|
| Title: | VAMAS Intercomparison of Critical Current Measurement in Nb3Sn Wires |
| Published: | March 01, 1989 |
| Abstract: | |
| Citation: | IEEE Transactions on Magnetics |
| Research Areas: | Standards |
| PDF version: | Click here to retrieve PDF version of paper (431KB) |