NIST Authors in Bold
| Author(s): | D Aized; J W. Haddad; C H. Joshi; Loren F. Goodrich; A N. Srivastava; |
|---|---|
| Title: | Comparing the Accuracy of Critical-Current Measurements Using the Voltage-Current Simulator |
| Published: | July 01, 1994 |
| Abstract: | |
| Citation: | IEEE Transactions on Magnetics |
| Volume: | 30(4) |
| Pages: | pp. 2014 - 2017 |
| Research Areas: | Standards |
| PDF version: | Click here to retrieve PDF version of paper (203KB) |