NIST Authors in Bold
| Author(s): | Loren F. Goodrich; L T. Medina; Theodore C. Stauffer; |
|---|---|
| Title: | Repeatability of Critical Current Measurements on Nb3Sn and Nb-Ti Wires |
| Published: | June 01, 1997 |
| Abstract: | |
| Citation: | IEEE Transactions on Applied Superconductivity |
| Volume: | 7(2) |
| Pages: | pp. 1508 - 1511 |
| Research Areas: | Standards |
| PDF version: | Click here to retrieve PDF version of paper (370KB) |