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|Author(s):||David K. Walker; Raian K. Kaiser; Dylan F. Williams; Kevin J. Coakley;|
|Title:||Lumped-Element Models for On-Wafer Calibration|
|Published:||December 01, 2000|
|Abstract:||We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.|
|Proceedings:||Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference|
|Pages:||pp. 1 - 4|
|Dates:||November 30-December 1, 2000|
|Keywords:||netowrk analyzer,on-waver calibration,OSLT,SOLR,SOLT,TRL calibration|
|Research Areas:||Microwave Measurement Services|
|DOI:||http://dx.doi.org/10.1109/ARFTG.2000.327431 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (64KB)|