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Publication Citation: Lumped-Element Models for On-Wafer Calibration

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Author(s): David K. Walker; Raian K. Kaiser; Dylan F. Williams; Kevin J. Coakley;
Title: Lumped-Element Models for On-Wafer Calibration
Published: December 01, 2000
Abstract: We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.
Proceedings: Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference
Volume: 38
Pages: pp. 1 - 4
Location: Boulder, CO
Dates: November 30-December 1, 2000
Keywords: netowrk analyzer,on-waver calibration,OSLT,SOLR,SOLT,TRL calibration
Research Areas: Microwave Measurement Services
DOI: http://dx.doi.org/10.1109/ARFTG.2000.327431  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (64KB)