NIST logo

Publication Citation: Repeat Measurements and Metrics for Nonlinear Model Development

NIST Authors in Bold

Author(s): Catherine A. Remley; Jeffrey A. Jargon; Dominique Schreurs; Donald C. DeGroot; Kuldip Gupta;
Title: Repeat Measurements and Metrics for Nonlinear Model Development
Published: June 06, 2002
Abstract: We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.
Conference: 2002 IEEE MTT-S International Microwave Symposium
Pages: pp. 2169 - 2172
Location: Seattle, WA
Dates: June 2-7, 2002
Keywords: large-signal measurements;measurement based models;model evaluation meters;nonlinear circuits;nonlinear network analysis;
Research Areas: Microwave Measurement Services
PDF version: PDF Document Click here to retrieve PDF version of paper (160KB)