| Author(s): |
Catherine A. Remley; Jeffrey A. Jargon; Dominique Schreurs; Donald C. DeGroot; Kuldip Gupta; |
| Title: |
Repeat Measurements and Metrics for Nonlinear Model Development |
| Published: |
June 06, 2002 |
| Abstract: |
We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics. |
| Conference: |
2002 IEEE MTT-S International Microwave Symposium |
| Pages: |
pp. 2169 - 2172 |
| Location: |
Seattle, WA |
| Dates: |
June 2-7, 2002 |
| Keywords: |
large-signal measurements;measurement based models;model evaluation meters;nonlinear circuits;nonlinear network analysis; |
| Research Areas: |
Microwave Measurement Services |
