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Publication Citation: Repeat Measurements and Metrics for Nonlinear Model Development

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Author(s): Catherine A. Remley; Jeffrey A. Jargon; Dominique Schreurs; Donald C. DeGroot; Kuldip Gupta;
Title: Repeat Measurements and Metrics for Nonlinear Model Development
Published: June 06, 2002
Abstract: We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.
Conference: 2002 IEEE MTT-S International Microwave Symposium
Volume: 3
Pages: pp. 2169 - 2172
Location: Seattle, WA
Dates: June 2-7, 2002
Keywords: large-signal measurements,measurement based models,model evaluation meters,nonlinear circuits,nonlinear network analysis
Research Areas: Microwave Measurement Services
DOI: http://dx.doi.org/10.1109/MWSYM.2002.1012301  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (396KB)