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|Author(s):||Catherine A. Remley; Jeffrey A. Jargon; Dominique Schreurs; Donald C. DeGroot; Kuldip Gupta;|
|Title:||Repeat Measurements and Metrics for Nonlinear Model Development|
|Published:||June 06, 2002|
|Abstract:||We develop a method for using metrics in conjunction with repeat measurements to study nonlinear models. We illustrate this procedure by investigating the performance of three types of measurement-based nonlinear circuit models using two different metrics.|
|Conference:||2002 IEEE MTT-S International Microwave Symposium|
|Pages:||pp. 2169 - 2172|
|Dates:||June 2-7, 2002|
|Keywords:||large-signal measurements,measurement based models,model evaluation meters,nonlinear circuits,nonlinear network analysis|
|Research Areas:||Microwave Measurement Services|
|DOI:||http://dx.doi.org/10.1109/MWSYM.2002.1012301 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (396KB)|