| Author(s): |
Dylan F. Williams; A. C. Byers; V. C. Tyree; David K. Walker; J. J. Ou; X. Jin; M. Piket-Moy; C. Hu; |
| Title: |
Contact-Pad Design for High-Frequency Silicon Measurements |
| Published: |
October 01, 2000 |
| Abstract: |
We measure and compare the electrical parasitics of contact pads of different designs fabricated on silicon integrated circuits and develop a strategy for reducing the parasitics. |
| Proceedings: |
Dig., 9th Elect. Perf. Elect. Pkg. Conf. |
| Pages: |
pp. 131 - 134 |
| Location: |
Scottsdale, AZ |
| Dates: |
October 23-25, 2000 |
| Keywords: |
characteristic impedance;contact pads;measurement;silicon;substrate effect; |
| Research Areas: |
Electromagnetics |
