Publication Citation
NIST Authors in Bold
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| Author(s): | R. H. McKnight; J. Lagnese; Y. Zhang; |
|---|---|
| Title: | Characterizing Transient Measurements by Use of the Step Response and the Convolution Integral |
| Published: | April 01, 1990 |
| Abstract: | |
| Citation: | IEEE Transactions on Instrumentation and Measurement |
| Volume: | 39 |
| Issue: | 2 |
| Pages: | pp. 346 - 352 |
| Research Areas: | Quantum Electrical Measurements |
| PDF version: |  Click here to retrieve PDF version of paper (2MB) |