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Publication Citation: Characterizing Transient Measurements by Use of the Step Response and the Convolution Integral

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Author(s): R. H. McKnight; J. Lagnese; Y. Zhang;
Title: Characterizing Transient Measurements by Use of the Step Response and the Convolution Integral
Published: April 01, 1990
Abstract:
Citation: IEEE Transactions on Instrumentation and Measurement
Volume: 39
Issue: 2
Pages: pp. 346 - 352
Research Areas: Quantum Electrical Measurements
PDF version: PDF Document Click here to retrieve PDF version of paper (2MB)