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Publication Citation: Appearance Potentials of Ions Produced by Electron-Impact Induced Dissociative Ionization of SF6 and Related Compounds

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Author(s): Ken L. Stricklett; J. M. Kassoff; James K. Olthoff; Richard J. Van Brunt;
Title: Appearance Potentials of Ions Produced by Electron-Impact Induced Dissociative Ionization of SF6 and Related Compounds
Published: March 01, 1995
Abstract: Methods are described, which are based on the use of a commercial mass spectrometer, for determination of ionization and fragment ion appearance potentials by electron impact. These methods are applied to the principal sulfur-bearing compounds produced by decomposition of SF6 by electrical discharges. The compounds investigated include: SF4, SO2, SOF2, SO2F2, SOF4, SF5Cl, S2F10, S2OF10, and S2O2F10, as well as SF6. Experimental conditions are recommended for improved sensitivity to trace levels of these decomposition by-products in SF6.
Proceedings: Proc., Intl. Symp. on Gaseous Dielectrics
Pages: pp. 257 - 264
Location: Knoxville, TN
Dates: April 24-28, 1994
Keywords: ;appearance potential;decomposition by-products;electron impact ionization;ionization potential;sulfur hexafluoride;
Research Areas: Electrical Metrology
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