NIST logo

Publication Citation: Sources of Error in Coplanar Waveguide TRL Calibrations

NIST Authors in Bold

Author(s): Raian K. Kaiser; Dylan F. Williams;
Title: Sources of Error in Coplanar Waveguide TRL Calibrations
Published: December 01, 1999
Abstract: This paper explores the impact of five sources of systematic error on coplanar waveguide thru-reflect-line calibrations.
Proceedings: Tech Dig., Auto. RF Tech. Group Conf.
Pages: pp. 75 - 80
Location: Atlanta, GA
Dates: December 2-3, 1999
Keywords: ;error analysis;measurement uncertainty;reference impedance;systematic uncertainty;
Research Areas: Microwave Measurement Services