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Publication Citation: Compensation for Geometrical Variations in Coplanar Waveguide Probe-Tip Calibration

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Author(s): David K. Walker; Dylan F. Williams;
Title: Compensation for Geometrical Variations in Coplanar Waveguide Probe-Tip Calibration
Published: April 01, 1997
Abstract: We show how coplanar-waveguide probe-tip scattering parameter calibrations performed in one coplanar waveguide conductor geometry may be adjusted for measurement in another. The method models the difference between the two probe-tip-to-coplanar-waveguide transitions as a change in shunt capacitance and applies previously developed techniques for its determination and compensation. Comparison to accurate multiline Thro-Reflect-Line calibrations verifies the accuracy of the method. Differences in both conductor geometry and substrate permittivity are considered in the comparison. The method requires only a single, compact open stub or thru line fabricated on the measurement wafer.
Citation: IEEE Microwave and Guided Wave Letters
Volume: 7
Issue: 4
Pages: pp. 97 - 99
Keywords: Automatic network analyzers,coplanar wave-guide,on-wafer calibration
Research Areas: Microwave Measurement Services
DOI: http://dx.doi.org/10.1109/75.563631  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (42KB)