Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||David K. Walker; Dylan F. Williams;|
|Title:||Compensation for Geometrical Variations in Coplanar Waveguide Probe-Tip Calibration|
|Published:||April 01, 1997|
|Abstract:||We show how coplanar-waveguide probe-tip scattering parameter calibrations performed in one coplanar waveguide conductor geometry may be adjusted for measurement in another. The method models the difference between the two probe-tip-to-coplanar-waveguide transitions as a change in shunt capacitance and applies previously developed techniques for its determination and compensation. Comparison to accurate multiline Thro-Reflect-Line calibrations verifies the accuracy of the method. Differences in both conductor geometry and substrate permittivity are considered in the comparison. The method requires only a single, compact open stub or thru line fabricated on the measurement wafer.|
|Citation:||IEEE Microwave and Guided Wave Letters|
|Pages:||pp. 97 - 99|
|Keywords:||Automatic network analyzers,coplanar wave-guide,on-wafer calibration|
|Research Areas:||Microwave Measurement Services|
|DOI:||http://dx.doi.org/10.1109/75.563631 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (42KB)|