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Publication Citation: On-Wafer Millimeter-Wave Characterization

NIST Authors in Bold

Author(s): Roger Marks;
Title: On-Wafer Millimeter-Wave Characterization
Published: October 01, 1998
Proceedings: Proc., European GAAS' 98 Symp.
Pages: pp. 21 - 26
Location: Amsterdam, NL
Dates: October 5-6, 1998
Research Areas: Microwave Measurement Services