NIST Authors in Bold
| Author(s): | James P. Randa; |
|---|---|
| Title: | Simulations of Noise-Parameter Uncertainties |
| Published: | June 07, 2002 |
| Abstract: | This paper reports results for uncertainties obtained using a Monte Carlo simulation of noise-parameter measurements. The simulator permits the computation of the dependence of the uncertainty in the noise parameters on uncertainties in the underlying quantities. Results have been obtained for the effect due to uncertainties in the reflection coefficients of the input terminations, the noise temperature of the hot noise source, connector variability, the ambient temperature, and the measurement of the output noise. Representative results are presented for both uncorrelated and correlated uncertainties in the underlying quantities. |
| Conference: | Intl. Microwave Symp. |
| Pages: | pp. 1845 - 1848 |
| Location: | Seattle, WA |
| Dates: | June 2-7, 2002 |
| Keywords: | amplifier noise parameters;measurement uncertainty;Monte Carlo simulation;noise measurement;thermal noise; |
| Research Areas: | Electronics & Telecommunications, Microwave Measurement Services, Electromagnetics |
| PDF version: | Click here to retrieve PDF version of paper (414KB) |