NIST Authors in Bold
| Author(s): | Yicheng Wang; Loucas G. Christophorou; James K. Olthoff; J. K. Verbrugge; |
|---|---|
| Title: | Electron Drift and Attachment in CHF3 and its Mixtures With Argon |
| Published: | May 01, 1999 |
| Abstract: | Measurements are reported of the electron drift velocity, w, in CHF3 gas and in its mixtures with argon. The E/N dependence of w in the mixtures exhibits regions of distinct negative differential conductivity. A small electron attachment rate constant (- 13 X 10-14 cm3 s-1 for density-reduced electric fields, E/N < 50 x 10-17 V cm2) has been measured, which may be due to impurities. |
| Citation: | Chemical Physics Letters |
| Pages: | pp. 303 - 308 |
| Keywords: | ;CHF3;electron attachment;electron drift velocity;electron transport; |
| Research Areas: | Electronics & Telecommunications |
| PDF version: | Click here to retrieve PDF version of paper (2MB) |