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PUBLICATIONS

The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic

Published

Author(s)

S. Avramov, Andrew D. Koffman, Nile M. Oldham, Bryan C. Waltrip
Proceedings Title
Proc. IEEE Instrumentation and Technology Conference (IMTC)
Conference Dates
May 24-26, 1999
Conference Location
Venice, 1, IT
Pub Type
Conferences

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Local Download
Conformance testing

Citation

Avramov, S. , Koffman, A. , Oldham, N. and Waltrip, B. (1999), The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic, Proc. IEEE Instrumentation and Technology Conference (IMTC), Venice, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=18201 (Accessed April 23, 2024)

Created April 30, 1999, Updated October 12, 2021