NIST Authors in Bold
| Author(s): | James K. Olthoff; Richard J. Van Brunt; J T. Herron; George G. Harman; |
|---|---|
| Title: | Catalytic Decomposition of S2F10 and Its Implications on Sampling and Detection from SF6-Insulated Equipment |
| Published: | June 01, 1990 |
| Abstract: | |
| Proceedings: | Proc., IEEE Intl. Symp. on Electrical Insulation |
| Pages: | pp. 248 - 252 |
| Location: | Toronto, CA |
| Dates: | June 3-6, 1990 |
| Research Areas: | Electrical Metrology |
| PDF version: | Click here to retrieve PDF version of paper (1MB) |