| Author(s): |
Jeffrey A. Jargon; Kuldip Gupta; |
| Title: |
Artificial Neural Network Modeling for Improved On-Wafer Line-Reflect-Match Calibrations |
| Published: |
September 01, 2001 |
| Abstract: |
We model a load using an artificial neural network (ANN) to improve an on-wafer line-reflect-match (LRM) calibration of a vector network analyzer. The ANN is trained with measurement data obtained from a thru-reflect-line (TRL) calibration. The accuracy of the LRM calibration using the ANN-modeled load compares favorably to a benchmark multiline TRL calibration with an average worst-case scattering parameter error bound of 0.017 over a 40 GHz bandwidth. |
| Conference: |
European Microwave Conference |
| Pages: |
pp. 229 - 232 |
| Location: |
London, UK |
| Dates: |
September 24-28, 2001 |
| Keywords: |
artificial neural network;calibration;line-refelct-match;network analyzer; |
| Research Areas: |
Microwave Measurement Services |
