Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Patrick J. Grother; D P. Casasent;|
|Title:||Optical Path Difference Measurement Techniques for SLMs|
|Published:||March 01, 2001|
|Abstract:||A simple measurement method to obtain 2-D spatial point-by-point optical path difference (OPD) data for spatial light modulators (SLMs) is described. A simple imaging system is used that allows measurements of all SLM parameters on the same laboratory systems. Simple digital processing of the output image for a uniform applied input voltage provides OPD data. Simple methods to confirm amplitude-mostly SLM operations are also provided. Results are presented for Kopin and CRL liquid crystal SLMs.PACS Classification codes - 42.79, 42.62, 42.87/|
|Keywords:||liquid crystals,optical path difference,spatial light modulators|