NIST Authors in Bold
| Author(s): | H Dai; T. M. Souders; |
|---|---|
| Title: | Time Domain Testing Strategies and Fault Diagnosis for Analog Systems |
| Published: | February 01, 1990 |
| Abstract: | |
| Citation: | IEEE Transactions on Instrumentation and Measurement |
| Volume: | 39 |
| Issue: | 1 |
| Pages: | pp. 157 - 162 |
| Research Areas: | Energy Conversion, Storage, and Transport |
| PDF version: | Click here to retrieve PDF version of paper (3MB) |