| Author(s): |
Uwe Arz; Dylan F. Williams; David K. Walker; J. E. Rogers; M. Rudack; D. Treytner; Hartmut Grabinski; |
| Title: |
Characterization of Asymmetric Coupled CMOS Line |
| Published: |
June 01, 2000 |
| Abstract: |
This paper investigates the properties of asymmetric coupled lines built in a 0.25 5m CMOS technology in the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from callibrated four-port S-parameter measurements agree well with data predicted by numerical calculations. To our knowledge these are the first complete high-frequency measurements of the line parameters for asymmetric coupled lines on silicon ever reported. |
| Proceedings: |
Dig., IEEE Microwave Theory Tech. Intl. Symp. |
| Pages: |
pp. 609 - 612 |
| Location: |
Boston, MA |
| Dates: |
June 11-16, 2000 |
| Keywords: |
;electromagnetic simulation;equivalent-circuit parameters;measurement;silicon;substrate effect transmission line; |
| Research Areas: |
Microwave Measurement Services |
