NIST Authors in Bold
| Author(s): | Dylan F. Williams; Uwe Arz; Hartmut Grabinski; |
|---|---|
| Title: | Characteristic-Impedance Measurement Error on Lossy Substrates |
| Published: | July 01, 2001 |
| Abstract: | This paper examines error in the characteristic impedance measured by the calibration comparison method. |
| Citation: | IEEE Microwave and Wireless Components Letters |
| Volume: | 11 |
| Issue: | 7 |
| Pages: | pp. 299 - 301 |
| Keywords: | ;characteristic impedance;lossy substrate;microstrip;parasitic pad capacitance;silicon;transmission line; |
| Research Areas: | Microwave Measurement Services |