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PUBLICATIONS

Characteristic-Impedance Measurement Error on Lossy Substrates

Published

Author(s)

Dylan Williams, Uwe Arz, Hartmut Grabinski

Abstract

This paper examines error in the characteristic impedance measured by the calibration comparison method.
Citation
IEEE Microwave and Wireless Components Letters
Volume
11
Issue
7
Pub Type
Journals

Download Paper

https://doi.org/10.1109/7260.933777
Local Download

Keywords

characteristic impedance, lossy substrate, microstrip, parasitic pad capacitance, silicon, transmission line
Electrical / electromagnetic metrology

Citation

Williams, D. , Arz, U. and Grabinski, H. (2001), Characteristic-Impedance Measurement Error on Lossy Substrates, IEEE Microwave and Wireless Components Letters, [online], https://doi.org/10.1109/7260.933777, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13906 (Accessed April 19, 2024)

Created June 30, 2001, Updated October 12, 2021