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Publication Citation: Characteristic-Impedance Measurement Error on Lossy Substrates

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Author(s): Dylan F. Williams; Uwe Arz; Hartmut Grabinski;
Title: Characteristic-Impedance Measurement Error on Lossy Substrates
Published: July 01, 2001
Abstract: This paper examines error in the characteristic impedance measured by the calibration comparison method.
Citation: IEEE Microwave and Wireless Components Letters
Volume: 11
Issue: 7
Pages: pp. 299 - 301
Keywords: characteristic impedance,lossy substrate,microstrip,parasitic pad capacitance,silicon,transmission line
Research Areas: Microwave Measurement Services
DOI: http://dx.doi.org/10.1109/7260.933777  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (232KB)