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Publication Citation: Noise Temperature Measurements on Wafer

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Author(s): James P. Randa;
Title: Noise Temperature Measurements on Wafer
Published: March 01, 1997
Abstract:
Citation: NIST TN - 1390
Volume: 1390
Pages: 64 pp.
Research Areas: Electronics & Telecommunications, Microelectronics, Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (4MB)