Publication Citation
NIST Authors in Bold
 |
| Author(s): | James P. Randa; |
|---|---|
| Title: | Noise Temperature Measurements on Wafer |
| Published: | March 01, 1997 |
| Abstract: | |
| Citation: | NIST TN - 1390 |
| Volume: | 1390 |
| Pages: | 64 pp. |
| Research Areas: | Electronics & Telecommunications, Microelectronics, Electromagnetics |
| PDF version: |  Click here to retrieve PDF version of paper (3MB) |