Publication Citation
NIST Authors in Bold
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| Author(s): | John G. Gillen; S V. Roberson; |
|---|---|
| Title: | Preliminary Evaluation of an SF5+ Polyatomic Primary Ion Beam for Analysis of Organic Thin Films by Secondary Ion Mass Spectrometry |
| Published: | December 01, 1998 |
| Abstract: | |
| Citation: | Rapid Communications in Mass Spectrometry |
| Volume: | 12 |
| Pages: | pp. 1303 - 1312 |
| Research Areas: | Nanotechnology, Chemistry |