Publication Citation
NIST Authors in Bold
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| Author(s): | David L. Duewer; H-K L. Liu; D J. Reeder; |
|---|---|
| Title: | Graphical Tools for RFLP Measurement Quality Assurance: Single-Locus Charts |
| Published: | September 01, 1999 |
| Abstract: | |
| Citation: | Journal of Forensic Sciences |
| Volume: | 44 |
| Issue: | 5 |
| Pages: | pp. 969 - 977 |
| Research Areas: | Chemistry, Quality |