Simons, D.
, Chi, P.
, Downing, R.
and Lamaze, G.
(1995),
The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry, AIP Press, Woodbury, NY
(Accessed April 16, 2024)
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The Development of Standard Reference Material 2137 - A Boron Implant in Silicon Standard for Secondary Ion Mass Spectrometry
Published
Author(s)
, , ,
Citation
Semiconductor Characterization Present Status and Future Needs
Publisher Info
AIP Press, Woodbury, NY
Pub Type
Books
Citation
Created December 1, 1995, Updated February 19, 2017