NIST Authors in Bold
| Author(s): | Scott A. Wight; G Gillen; T M. Herne; |
|---|---|
| Title: | Development of Environmental Scanning Electron Microscopy Electron Beam Profile Imaging with Self-Assembled Monolayers and Secondary Ion Mass Spectroscopy |
| Published: | December 01, 1997 |
| Abstract: | |
| Citation: | Scanning |
| Volume: | 19 |
| Pages: | pp. 71 - 74 |
| Research Areas: | Nanotechnology, Chemistry |