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Publication Citation: Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS

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Author(s): Scott A. Wight; G Gillen; T M. Herne;
Title: Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS
Published: December 01, 1997
Abstract:
Conference: Microscopy and Microanalysis Proceedings
Proceedings: Microscopy and Microanalysis
Pages: pp. 1209 - 1210
Location: xxxx, -1
Dates: February 13, 2009
Research Areas: Nanotechnology, Chemistry