Publication Citation
NIST Authors in Bold
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| Author(s): | Scott A. Wight; G Gillen; T M. Herne; |
|---|---|
| Title: | Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS |
| Published: | December 01, 1997 |
| Abstract: | |
| Conference: | Microscopy and Microanalysis Proceedings |
| Proceedings: | Microscopy and Microanalysis |
| Pages: | pp. 1209 - 1210 |
| Location: | xxxx, -1 |
| Dates: | February 13, 2009 |
| Research Areas: | Nanotechnology, Chemistry |