NIST Authors in Bold
| Author(s): | G Redmond; C Gilles; M Fialin; O Rouer; Ryna B. Marinenko; Robert L. Myklebust; Dale E. Newbury; |
|---|---|
| Title: | Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region |
| Published: | December 01, 1996 |
| Abstract: | |
| Citation: | Mikrochimica ACTA |
| Volume: | S |
| Pages: | pp. 61 - 86 |
| Research Areas: | Nanotechnology |