Publication Citation
NIST Authors in Bold
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| Author(s): | J Lorincik; J Fine; John G. Gillen; |
|---|---|
| Title: | The Scanning Scattering Microscopy for Surface and Buried Interface Roughness and Defect Imaging |
| Published: | December 01, 1997 |
| Abstract: | |
| Conference: | Proceedings of the Society of Photo-Optical Instrumentation Engineers |
| Proceedings: | Society of Photo-Optical Instrumentation Engineers |
| Pages: | 3141 pp. |
| Location: | backfill, -1 |
| Dates: | February 11, 2009 |
| Research Areas: | Nanotechnology, Chemistry |