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Publication Citation: Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS

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Author(s): Scott A. Wight; G Gillen; T M. Herne;
Title: Measurement of ESEM Electron Beam Profiles with Self-Assembled Monolayers and SIMS
Published: December 01, 1997
Abstract:
Citation: Scanning Microscopy
Volume: 19
Pages: pp. 71 - 74
Research Areas: Nanotechnology, Chemistry