NIST logo
NIST Home > Manufacturing Metrology Portal 

Manufacturing Metrology Portal

Programs and Projects
Thin Film Electronics

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Dimensional Measurement Services

The Dimensional Measurement Services (DMS) project enables innovation, commercialization, and global trade of U.S. products by providing a path … more

CMOS Device and Reliability

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Atom-Based Dimensional Metrology

To fabricate and measure solid state implementations of manufacturable atomically precise devices. Build the infrastructure to fabricate prototype … more

Traceable Scanning Probe Nano-Characterization

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Nano-Structured Optics and Optical Surface Metrology

The project focuses on significant metrology challenges that impede the advancement of high-performance optical and photonic systems. We develop, … more

Instruments
Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

*
Bookmark and Share

Contact

General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070