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Manufacturing Metrology Portal

Programs and Projects
SI Length and Traceability

We maintain and develop methods to provide traceability to the meter via laser frequency/wavelength. The most significant source of uncertainty in … more

International System of Units (SI)

The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more

Aperture area measurements

Radiometric and photometric measurements require defining apertures. The accuracy to which these measurements can be accomplished requires … more

Thin Film Electronics

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Dimensional Measurement Services

The Dimensional Measurement Services (DMS) project enables innovation, commercialization, and global trade of U.S. products by providing a path … more

CMOS Device and Reliability

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Instruments
Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

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Contact

General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070