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Manufacturing Metrology Portal

Programs and Projects
CMOS Device and Reliability

The CMOS Device and Reliability Project develops advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide Semiconductor) … more

Atom-Based Dimensional Metrology

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Thin Film Electronics

The Thin Film Electronics Project facilitates the commercialization of emerging and future semiconductor electronic device technologies by … more

Traceable Scanning Probe Nano-Characterization

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Dimensional Measurement Services

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Crystallographic Databases

Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured … more

Instruments
Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

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