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Manufacturing Metrology Portal

Programs and Projects
Optical Methods for 3-D Nanostructure Metrology

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

SI Length and Traceability

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Nano-Structured Optics and Optical Surface Metrology

Aspheric, free-form, and nano-structured surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture … more

Advanced Dimensional Measurement Systems for Manufacturing

The US manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to more rapidly inspect high … more

Dimensional Measurement Services

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Atom-Based Dimensional Metrology

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Instruments
Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

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inquiries@nist.gov

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