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Manufacturing Metrology Portal

Programs and Projects
International System of Units (SI)

The International System of Units (SI) provides definitions of units of measurement that are widely accepted in science and technology and which … more

SI Length and Traceability

We maintain and develop methods to provide traceability to the meter via laser frequency/wavelength. The most significant source of uncertainty in … more

Aperture area measurements

Radiometric and photometric measurements require defining apertures. The accuracy to which these measurements can be accomplished requires … more

Thin Film Electronics

The Thin Film Electronics Project develops rigorous measurements and methodology needed for continued U.S. leadership in manufacturing and … more

Dimensional Measurement Services

The Dimensional Measurement Services (DMS) project enables innovation, commercialization, and global trade of U.S. products by providing a path … more

CMOS Device and Reliability

  The CMOS Device and Reliability Project aims to develop new metrology tools for characterizing high-performance complementary … more

Aperture area measurement facility

NIST has established an absolute aperture area measurement facility for circular and near-circular apertures use in radiometric instruments. The … more

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